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ICB 2012
The 5th IAPR International Conference on Biometrics

March 29 - April 1, 2012 New Delhi, India

Program Committee


Mohamed Abdel-Mottaleb, University of Miami, USA
Lale Akarun, Bogazici University, Turkey
José Luis Alba-Castro, Universidad de Vigo, Spain
Fernando Alonso-Fernandez, Halmstad University, Sweden
George Bebis, University of Nevada, USA
Olga Bellon, Universidade Federal do Paraná, Brazil
Vijayakumar Bhagavatula, Carnegie Mellon University, USA
Bir Bhanu, University of California, Riverside, USA
Josef Bigun, Halmstad University, Sweden
Patrick Bours, Gjřvik University College, Norway
Terrance Boult, University of Colorado, USA
Julien Bohne, Morpho, France
Vincent Bouatou, Morpho, France
Thirimachos Bourlai, West Virginia University, USA
Julien Bringer, Morpho, France
Christoph Busch, Fraunhofer IGD, Germany
Hyeran Byun, Yonsei University, Korea
Patrizio Campisi, University of Roma TRE, Italy
Raffaele Cappelli, University of Bologna, Italy
Heeseung Choi, Michigan State University, USA
John Daugman, University of Cambridge, UK
Larry Davis, University of Maryland, USA
Farzin Deravi, University of Kent, UK
Andrzej Drygajlo, EPFL, Switzerland
Jean-Luc Dugelay, EURECOM, France
Jianjiang Feng, Tsinghua University, China
Miguel Ferrer-Ballester, UPLGC, Spain
Patrick Flynn, University of Notre Dame, USA
Carmen Garcia-Mateo, Universidad de Vigo, Spain
Berk Gokberk, University of Twente, The Netherlands
Venu Govindaraju, University at Buffalo, SUNY, USA
Patrick Grother, NIST, USA
Vincent Hsu, L1 ID, USA
Anil Jain, Michigan State University, USA
Xudong Jiang, Nanyang Technological University, Singapore
Ioannis Kakadiaris, University of Houston, USA
Behrooz Kamgar-Parsi, Naval Research Laboratory, USA
Emile Kelkboom, Philips Research Europe, The Netherlands
Daijin Kim, POSTECH, Korea
Hikim Kim, Inha University, Korea
Josef Kittler, University of Surrey, UK
Justas Kranauskas, Neurotechnology, USA
Ajay Kumar, The Hong Kong Polytechnic University, HK
Kuang-Chih Lee, Turn Inc., USA
Sangyoun Lee, Yonsei University, Korea
Stan Li, Chinese Academy of Sciences, China
Shengcai Liao, Michigan State University, USA
Davide Maltoni, Universitŕ di Bologna, Italy
Aleix Martinez, The Ohio State University, USA
John Mason, Swansea University, UK
James Matey, US Naval Academy, USA
Anoop Namboodiri, IIIT Hyderabad, India
Karthik Nandakumar, Institute for Infocomm Research, Singapore
Mark Nixon, University of Southampton, UK
Alice O'Toole, University of Texas at Dallas, USA
Javier Ortega-Garcia, Universidad Autonoma de Madrid, Spain
Sharath Pankanti, IBM, USA
Kang Ryoung Park, Dongguk University, Korea
Jonathon Phillips, NIST, USA
Matti Pietikainen, University of Oulu, Finland
Ioannis Pitas, University of Thessaloniki, Greece
Norman Poh, University of Surrey, UK
Hugo Proenca, University of Beira Interior,Portugal
Daniel Ramos, Universidad Autonoma de Madrid, Spain
Shantanu Rane, MERL, USA
Karl Ricanek, University of North Carolina Wilmington, USA
Fabio Roli, University of Cagliari, Italy
Bulent Sankur, Bogazici University, Turkey
Sudeep Sarkar, University of South Florida, USA
Stephanie Schuckers, Clarkson University, USA
Jidnya Shah , Siemens Research, USA
Richa Singh, IIIT-Delhi, India
Anuj Srivastava, Florida State University, USA
Alex Stoianov, Information and Privacy Commissioner, Canada
Zhenan Sun, Chinese Academy of Sciences, China
Tamás Szirányi, Veszprém University, Hungary
Elham Tabassi, NIST, USA
Andrew Teoh, Yonsei University, Korea
Jie Tian, Chinese Academy of Sciences, China
Massimo Tistarelli, University of Sassari, Italy
Kar-Ann Toh, Yonsei University, Korea
Matthew Turk, University of California, Santa Barbara, USA
Mayank Vatsa, IIIT-Delhi, India
Yun-Hong Wang, Chinese Institute of Electronics, China
Damon Woodard, Clemson University, USA
Haiyun Xu, University of Twente, The Netherlands
Bian Yang, Gjřvik University College, Norway
Wei-Yun Yau, Institute for Infocomm Research, Singapore
B. Yegnanayarana, IIIT Hyderabad, India
Pong Yuen, Hong Kong Baptist University, HK
David Zhang, Hong Kong Polytechnic University, HK
Lei Zhang, The Hong Kong Polytechnic University, HK
Jie Zhou, Tsinghua University, China